Publikationen
Deep Face Age Progression: A Survey
Autor | Grimmer, M.; Raghavendra, R.; Busch, C. |
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Datum | 2021 |
Art | Journal Article |
In | IEEE Access, Vol.9, p.83376-83393 |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Schlüssel | Grimmer2021 |