Security Requirements Engineering in Safety-Critical Railway Signalling Networks
Heinrich, Markus; Vateva-Gurova, Tsvetoslava; Arul, Tolga; Katzenbeisser, Stefan; Suri, Neeraj; Birkholz, Henk; Fuchs, Andreas; Krauß, Christoph; Zhdanova, Maria; Kuzhiyelil, Don; Tverdyshev, Sergey; Schlehuber, Christian
Security and Communication Networks, Vol.vol. 2019, Article ID 8348925, p.14 pages
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Datenschutz muss benutzbar sein
Heinemann, Andreas; Straub, Tobias
Datenschutz und Datensicherheit, Vol.43, p.7-12
[Journal Article]

Relevant features for Gender Classification in NIR Periocular Images
Viedma, I.; Tapia, J.; Iturriaga, A.; Busch, C.
arXiv e-prints
[Journal Article]

Privacy-preserving PLDA Speaker Verification Using Outsourced Secure Computation
Treiber, A.; Nautsch, A.; Kolberg, J.; Schneider, T.; Busch, C.
Speech Communication, Vol.114, p.60-71
[Journal Article]

Detection of Face Morphing Attacks based on PRNU Analysis
Scherhag, U.; Debiasi, L.; Rathgeb, C.; Busch, C.; Uhl, A.
Trans. on Biometrics, Behavior, and Identity Science (TBIOM)
[Journal Article]

Face Recognition Systems under Morphing Attacks: A Survey
Scherhag, U.; Rathgeb, C.; Merkle, J.; Breithaupt, R.; Busch, C.
IEEEAccess
[Journal Article]

Impact and Detection of Facial Beautification in Face Recognition: An Overview
Rathgeb, C.; Dantcheva, A.; Busch, C.
IEEE Access, Vol.7, p.152667-152678
[Journal Article]

Preserving Privacy in Speaker and Speech Characterisation
Nautsch, A.; Jiménez, A.; Treiber, A.; Kolberg, J.; Jasserand, C.; others
Computer Speech \& Language, Vol.58, p.441-480
[Journal Article]

Fingerprint Presentation Attack Detection Based on Local Features Encoding for Unknown Attacks
González-Soler, L. J.; Gomez-Barrero, M.; Chang, L.; Pérez-Suárez, A.; Busch, C.
arXiv preprint
[Journal Article]

Light Fields for Face Analysis
Galdi, C.; Chiesa, V.; Busch, C.; Correia, P. Lobato; Dugelay, J.-L.; Guillemot, C.
IEEE Sensors Journal, Vol.19, p.2687
[Journal Article]

Computational Workload in Biometric Identification Systems: An Overview
Drozdowski, P.; Rathgeb, C.; Busch, C.
IET Biometrics, Vol.8, p.351-368
[Journal Article]